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MIT.nano receives grant to acquire focused ion beam scanning electron microscope（图）
聚焦离子束 扫描电子显微镜 双束纳米制造平台
2023/6/9
The VELION FIB-SEM, a next-generation dual-beam nanofabrication platform located in MIT.nano, will become a permanent part of the facility’s characterization capabilities, thanks in part to a Major Re...
New Approaches to Characterisation of Textile Materials Using Environmental Scanning Electron Microscope
Environmental Scanning Electron Microscope (ESEM) textiles imaging dynamic process
2009/2/7
Textile materials are designed to create the microstructure that gives the final product its characteristic properties for a wide range of applications. It is of importance to understand how a particu...
专著信息
书名
Antagonistical mode of Pichia membranefaciens to Rhizopus stolonifer in wounds of peach fruit by scanning electron microscope.
语种
中文
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作者
Wan YK,Tian SP
第一作者单位
出版社
Acta Botanic Sinica, 44（...
期刊信息
篇名
Ultrastructural study of polyspermy during early embryo development in pigs,observed by scanning electron microscope and transmission electron microscope
语种
英文
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撰写
作者
Ping Xia,Zhouji Wang...