搜索结果: 1-9 共查到“电子科学与技术 Degradation”相关记录9条 . 查询时间(0.07 秒)
The objective is to fabricate organic light emitting
diode and to study its degradation process in atmosphere condition in
which PFO as an emitting material and PEDOT:PSS as a hole
injecting materi...
Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors
Hot-carrier P-MOS transistor lifetime prediction
2009/7/28
Along with advances in microelectronics, and computer and space technologies, device dimensions are becoming smaller; as a result, hot-carrier effect, lifetime prediction, and reliability become more ...
The Degradation of Epoxy Resin-Coated ZnO Varistors at Elevated Temperatures and Ambient Humidity Conditions
Zinc oxide (ZnO) ceramics Varistor Degradation Epoxy resin powder Ageing Insulating material
2010/12/7
The degradation of the epoxy resin-coated commercial ZnO varistors at elevated temperatures and ambient humid conditions has been investigated experimentally. It has been observed that the leakage cur...
Analysis and Simulation of Functional Stress Degradation on VDOMS Power Transistors
Functional Stress VDOMS Power Transistors
2010/12/7
The use of VDMOS transistor under certain functional stress conditions produces a modification of its physical and electrical properties. This paper explores the physical analysis and SPICE simulation...
Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor
Junction Parameters an Electrically Stressed NPN Bipolar Transistor
2010/12/8
The effect of an electrical ageing on npn bipolar transistor has been studied. The current gain decreases substantially and the electrical properties are discussed. The emitter-base junction parameter...
Degradation of VDMOSFET by Heavy Ion Irradiations
Hot-holes transistor degradation fast surface states ionization radiation
2010/12/8
This article focuses on the effect of the heavy ions irradiations on the electrical characteristics of VDMOSFET (Vertical Diffusion Metal Oxide Semiconductor Field Effect Transistor) devices. A summar...
Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors
Hot-carrier degradation MOSFET gate geometry
2010/12/9
Device degradation due to hot-carrier in n-channel HEXFETs is shown to be related to the device geometrical structure. The form of I-V characteristics of the body-drain junction is found dependent of ...
Voltage Degradation Model of Thin Film Capacitors
Voltage Degradation Model Thin Film Capacitors
2010/12/23
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a f...
Aging Degradation of Ni and NiCr-Ni Thin Film Conductor Systems
an experimental procedure NiCr-Ni Thin Film Conductor Systems
2010/12/28
In this paper an experimental procedure for the evaluation of the Ni and NiCr-Ni new low cost conductor systems is described. The possibility of an application of these conductor systems as a contact ...