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On Detection, Analysis and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI
Automatic Test Pattern Generation Crosstalk Design-for-Testability Integrated Circuit Intermittent Failure Soft Error
2014/11/7
As we move deep into nanometer regime of CMOS VLSI (45nm node and below), the device noise margin gets sharply eroded because of continuous lowering of device threshold voltage together with ever incr...
Parametric Studies of Pulsed Nd:YAG Laser Deposition of ITO for OLED Application
Indium tin oxide Pulsed Nd:YAG laser Background gases OLED
2009/6/1
Device-quality ITO by pulsed Nd:YAG laser, successfully used for Organic Light Emitting Device (OLED), was deposited at room temperature and 250 °C. Although the optical transmittance of > 90% is achi...