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On Detection, Analysis and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI
Automatic Test Pattern Generation Crosstalk Design-for-Testability Integrated Circuit Intermittent Failure Soft Error
2014/11/7
As we move deep into nanometer regime of CMOS VLSI (45nm node and below), the device noise margin gets sharply eroded because of continuous lowering of device threshold voltage together with ever incr...
State variable distributed-parameter representation of transmission line for transient simulations
state-space methods power system transients Transmission line modeling
2010/10/12
In this paper, a distributed-parameter state variable approach is used to calculate transients on transmission lines based on the concept of travelling waves. The method of characteristics for lossles...
Transient Phenomena in Sputtered CdS Photocells
Transient Phenomena Sputtered CdS Photocells
2011/1/10
We describe experimental data and theoretical studies of response time measurements in sandwich structures Al—CdS—Au. The speed of response is about 2 μs in a large sensitivity range. A theoretical si...
Transient Phenomena in Sputtered CdS Photocells
Transient Phenomena Sputtered CdS Photocells
2011/1/21
We describe experimental data and theoretical studies of response time measurements in sandwich structures Al—CdS—Au. The speed of response is about 2 μs in a large sensitivity range. A theoretical si...